Title:
ULTRASOUND WAVE INSPECTION SYSTEM
Document Type and Number:
Japanese Patent JP2018194528
Kind Code:
A
Abstract:
To provide an ultrasound wave inspection system that can detect internal defects with high sensitivity as avoiding interference of an acute-angled probe with an interference part of an analyte.SOLUTION: An ultrasound wave inspection system comprises a probe movement device 23 that arranges a transmission-purpose acute-angled probe 21 and a reception-purpose acute-angled probe 22 so that a transmission point Pand a reception point Pare located on a crossing line E where a virtual panel surface C including a scan point D of a welding boundary surface 13a and a normal line vector of the boundary surface goes across an outer surface 12a of a lower mirror pedal part 12, and so as to avoid interference with an interference part of a RIP casing 15 and the like. The probe movement device 23 has: a driving device 31A that is made movable along a circumferential direction of a welding part 13, and moves the transmission-purpose acute-angled probe 21 along a generatrix direction Kof the outer surface 12a at a circumferential direction position of the welding part; and a driving device 31B that is made movable along the circumferential direction of the welding part 13, and moves the reception-purpose acute-angled probe 22 along a generatrix direction Kof the outer surface 12a at the circumferential direction position of the welding part.SELECTED DRAWING: Figure 10
Inventors:
OSHIMA YUKI
OUCHI HIROFUMI
EBARA KAZUYA
WATANABE YUTA
ARAI MINORU
OUCHI HIROFUMI
EBARA KAZUYA
WATANABE YUTA
ARAI MINORU
Application Number:
JP2017101022A
Publication Date:
December 06, 2018
Filing Date:
May 22, 2017
Export Citation:
Assignee:
HITACHI GE NUCLEAR ENERGY LTD
International Classes:
G01N29/265
Attorney, Agent or Firm:
Kaichi International Patent Office