Title:
Cu ALLOY FOR ELECTRIC AND ELECTRONIC DEVICE, AND PROBE PIN USING THE SAME
Document Type and Number:
Japanese Patent JP2019026921
Kind Code:
A
Abstract:
To provide a following Cu alloy for electric and electronic device low in specific resistance, and excellent in total balance with hardness and processability.SOLUTION: The Cu alloy for electric and electronic device contains Ag of 3 mass% to 30 mass%, In of 5 mass% or more and less than 10 mass%, and the balance Cu with inevitable impurities for achieving the aim. According to the invention, processability is good and hardness enough to be used as a probe pin can be achieved by plastic working.SELECTED DRAWING: Figure 1
Inventors:
SHISHINO RYU
TAKAHASHI MASATO
TAKAHASHI MASATO
Application Number:
JP2017151023A
Publication Date:
February 21, 2019
Filing Date:
August 03, 2017
Export Citation:
Assignee:
TOKURIKI HONTEN KK
International Classes:
C22C9/00; C22F1/08; G01R1/06; H01L21/66
Attorney, Agent or Firm:
Katsuhiro Yoshimura
Hiroko Negishi
Kayo Ono
Hiroko Negishi
Kayo Ono