Title:
LIGHT REFLECTION MEASURING DEVICE AND METHOD THEREFOR
Document Type and Number:
Japanese Patent JP2019052938
Kind Code:
A
Abstract:
To provide a light reflection measuring device for analyzing disturbance or compensating for it and realizing a high spacial resolution under an environment where a fiber to be measured is subject to disturbance such as vibration, and a method therefor.SOLUTION: Continuous light emitted from a frequency swept light source 101 is bifurcated by an optical demultiplexer 111, one being entered to a circling optical path 102 from an optical multiplexer/demultiplexer 112 and the other reflected (scattered) light being handled as local light for coherent detection. The continuous light after propagation through the circling optical path 102 is entered to a fiber 200 to be measured via the optical multiplexer/demultiplexer 112, an optical circulator 108 and a dummy fiber 109 for optical phase reference, and is reflected (scattered) in the dummy fiber 109 for optical phase reference and the fiber 200 to be measured. A beat signal of the reflected (scattered) light outputted from an optical multiplexer 113 and the local light is converted into an electric signal by a receiver 105, and signal processing is applied in an arithmetic processing device 107 to compensate for phase noise due to disturbance having occurred in the fiber 200 to be measured.SELECTED DRAWING: Figure 4
Inventors:
ONO SINGO
IIDA DAISUKE
KOMO KUNIHIRO
MANABE TETSUYA
IIDA DAISUKE
KOMO KUNIHIRO
MANABE TETSUYA
Application Number:
JP2017177149A
Publication Date:
April 04, 2019
Filing Date:
September 14, 2017
Export Citation:
Assignee:
NIPPON TELEGRAPH & TELEPHONE
International Classes:
G01M11/00; H04B10/071
Domestic Patent References:
| JP2008523396A | 2008-07-03 | |||
| JP2015500483A | 2015-01-05 | |||
| JP2010271137A | 2010-12-02 |
Foreign References:
| WO2008105322A1 | 2008-09-04 | |||
| US20170052091A1 | 2017-02-23 |
Attorney, Agent or Firm:
Patent Business Corporation Tani/Abe Patent Office