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Title:
IMAGE FORMATION APPARATUS, CORRECTION METHOD OF EXPOSURE POSITION, PROGRAM AND MANUFACTURING METHOD OF TEST CHART FORMATION MEDIUM
Document Type and Number:
Japanese Patent JP2019077138
Kind Code:
A
Abstract:
To provide an image formation apparatus, a correction method of an exposure position, a program and a manufacturing method of a test chart formation medium which can more precisely correct the deviation of the exposure position that has occurred subsequently.SOLUTION: An image formation apparatus forms an electrostatic latent image in a mirror surface identification pattern that can identify a reference portion formed with scanning by one mirror surface by performing the two-dimensional exposure by making the clock characteristic of the writing clock used in the scanning by the one mirror surface of a rotary polygon mirror different from the clock characteristic related to the other mirror surface, forms an electrostatic latent image in a detection pattern by performing the two-dimensional exposure at a prescribed relative position with respect to the mirror surface identification pattern, identifies the mirror surface used in formation of each section of the detection pattern from the physical relation between the reference portion and the detection pattern on the basis of the reading result of the recording medium formed with the test chart including the mirror surface identification pattern and the detection pattern, and performs correction by detecting the deviation related to each of the plurality of mirror surfaces on the basis of the identification result of the mirror surface and the detection pattern.SELECTED DRAWING: Figure 9

Inventors:
ESUMI SADAHIRO
Application Number:
JP2017207712A
Publication Date:
May 23, 2019
Filing Date:
October 27, 2017
Export Citation:
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Assignee:
KONICA MINOLTA INC
International Classes:
B41J2/47; G02B26/12; G03G21/00; H04N1/04; H04N1/113
Domestic Patent References:
JP2012098454A2012-05-24
JPH05167793A1993-07-02
JP2012137658A2012-07-19
JP2012226051A2012-11-15
JP2004271691A2004-09-30
JP2013097034A2013-05-20
JP2015150850A2015-08-24
JP2002267961A2002-09-18
JP2005337995A2005-12-08
Foreign References:
US6259467B12001-07-10
Attorney, Agent or Firm:
Gwangyang International Patent Office