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Title:
DISPLACEMENT MEASUREMENT JIG AND DISPLACEMENT MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2019124709
Kind Code:
A
Abstract:
To provide a displacement measurement jig and displacement measurement method that can readily and precisely a displacement of a structure using a vernier caliper and the like, and are simply structured.SOLUTION: A substrate 38 is provided in a reference surface 20(1) of one structure 14(1), one part of the substrate 38 provided in the one structure 14(1) faces a reference surface 20(2) of other structure 14(2), and a through-hole 34 for measuring a distance between the substrate 38 and the reference surface 20(2) of the other structure 14(2) is provided in the substrate 38 facing the reference surface 20(2) of the other structure 14(2). By the through-hole 34, the distance between the substrate 38 and the reference surface 20(2) of the other structure 14(2) is measured. On the basis of the distance between the reference surface 20(2) of the other structure 14(2) and the substrate 38 by a plurality of through-holes 34, a tilt of the other structure 14(2) to the one structure 14(1) is calculated.SELECTED DRAWING: Figure 1

Inventors:
NAKANO YUKINAGA
ITO HAJIME
KOMORI TORU
MATSUDA KOICHI
Application Number:
JP2019090542A
Publication Date:
July 25, 2019
Filing Date:
May 13, 2019
Export Citation:
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Assignee:
AIPEKKU KK
UNIV TOYAMA PREFECTURAL
NAKANIHON HIGHWAY ENG NAGOYA KK
International Classes:
G01B5/00; G01B5/24
Domestic Patent References:
JPH0821703A1996-01-23
JP2003254702A2003-09-10
JPS6176302U1986-05-22
JP2007120178A2007-05-17
JPH11148821A1999-06-02
Attorney, Agent or Firm:
Isao Hirosawa