Title:
DISPLAY DEVICE AND INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2019133029
Kind Code:
A
Abstract:
To provide a display device that can improve a quality.SOLUTION: A display device has: a first substrate 1 in which a display unit 11 is provided; a driver IC6 that has a picture image line drive circuit 61 driving the display unit 11 integrated; a second substrate 2 in which the driver IC6 is provided; a signal selection circuit 14 that is provided between the display unit 11 and the driver IC6, and is arranged in the first substrate 1; a plurality of first wiring which are wired in the first substrate 1, and of which one end is electrically connected to the signal selection circuit 14; a plurality of second wiring which are wired in the second substrate 2, and of which one end is electrically connected to the driver IC6; and a plurality of connection terminals 53 in which other end of the first wiring and other end of the second wiring are electrically connected. As a control state the driver IC6 can take, the display device includes: a first control state where the signal selection circuit 14 is subjected to open control and a potential difference is not applied between adjacent connection terminals 53; and a second control state where the signal selection circuit 14 is subjected to the open control, and the potential difference is applied between the adjacent connection terminals 53.SELECTED DRAWING: Figure 4
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Inventors:
KATO MOTONARI
KOTANI YOSHIHIRO
IMAI RYO
NITOBE RYUTARO
KOTANI YOSHIHIRO
IMAI RYO
NITOBE RYUTARO
Application Number:
JP2018015648A
Publication Date:
August 08, 2019
Filing Date:
January 31, 2018
Export Citation:
Assignee:
JAPAN DISPLAY INC
International Classes:
G09F9/00; G01R31/00; G01R31/02; G09F9/30; G09G3/20
Domestic Patent References:
| JP2006139167A | 2006-06-01 | |||
| JPH0749363A | 1995-02-21 | |||
| JP2013058428A | 2013-03-28 | |||
| JP2009122285A | 2009-06-04 | |||
| JP2017138393A | 2017-08-10 | |||
| JP2012173598A | 2012-09-10 |
Attorney, Agent or Firm:
Sakai International Patent Office