Title:
DIAGNOSTIC SYSTEM, DIAGNOSTIC DEVICE, AND METHOD FOR DIAGNOSIS
Document Type and Number:
Japanese Patent JP2019168300
Kind Code:
A
Abstract:
To provide a diagnostic system, a diagnostic device, and a method for diagnosis which allow a user to know an appropriate time to clean a facility.SOLUTION: The present diagnostic system is for diagnosing a facility where an insulating object is provided, and includes: a surface resistance sensor in the facility for outputting a divided voltage, the sensor having a first surface resistor and a second surface resistor connected in series so that the voltage of a DC power source will be divided, the second surface resistor being equipped with a protective member on a surface resistor different from the first surface resistor; and a diagnosis unit for estimating the time to clean the facility on the basis of the relation between the voltage value output from the surface resistor sensor and a predetermined threshold value.SELECTED DRAWING: Figure 1
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Inventors:
TATEMI MASARU
ROKUNOHE TOSHIAKI
FUJITA HIKARI
IIZUKA KEITA
ROKUNOHE TOSHIAKI
FUJITA HIKARI
IIZUKA KEITA
Application Number:
JP2018055393A
Publication Date:
October 03, 2019
Filing Date:
March 22, 2018
Export Citation:
Assignee:
HITACHI LTD
International Classes:
G01R31/00; G01N27/00; G01N27/04; G01R31/02
Domestic Patent References:
| JPH08220158A | 1996-08-30 | |||
| JP2006170882A | 2006-06-29 | |||
| JP2015068652A | 2015-04-13 |
Attorney, Agent or Firm:
Patent Business Corporation Sunnext International Patent Office