Title:
GENE INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2019176819
Kind Code:
A
Abstract:
To provide a gene inspection device capable of leaving on an inspection structure, information for identifying from which stage an operation can be started again when abnormal stop has occurred in a halfway of the operation.SOLUTION: A gene inspection device 100A executes a plurality of operations for gene inspection to an inspection structure 1 which comprises an RFID tag 10S capable of recording prescribed information and stores a sample. The gene inspection device 100A has a recording control part 101E comprising a function for outputting a command for recording information to the RFID tag 10S, and a function for reading information recorded in the RFID tag 10S from the RFID tag 10S. The recording control part 101E outputs a command to the RFID tag 10S to record information indicating a final operation which was executed finally before abnormal stop of the gene inspection device 100A and a period since a start period of the final operation to the abnormal stop.SELECTED DRAWING: Figure 8
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Inventors:
MIYAMURA YUKIHARU
Application Number:
JP2018069121A
Publication Date:
October 17, 2019
Filing Date:
March 30, 2018
Export Citation:
Assignee:
DAIKEN IKI KK
International Classes:
C12M1/00; G01N35/00; G01N35/08
Attorney, Agent or Firm:
Etsushi Kotani
Masataka Otani
Atsushi Yamamoto
Masataka Otani
Atsushi Yamamoto