Title:
AHEAD SICK DETECTOR AND PATHOLOGY TENDENCY ANALYSIS SYSTEM (AHEAD SICK CHECKER)
Document Type and Number:
Japanese Patent JP2019195601
Kind Code:
A
Abstract:
To develop a dedicated autonomic nerve measurement device and construct a series of system for detecting a pathology tendency of an individual on the basis of an ahead sick stage as an ahead sick checker, since statistic data indicating association between measurement data at ryodoraku measurement point on the basis of a ryodoraku theory and symptom is not formally accumulated and collected.SOLUTION: A measurement point on the basis of the ryodoraku theory is measured by a dedicated autonomic nerve measurement device which is newly developed, then the acquired data is communicated to application software mounted on a smartphone to collect and accumulate measurement data in a host computer, thereby constructing big data. The ahead sick checker comprises a system in which a large amount of information accumulated in the host computer is subjected to pathology tendency analysis by an artificial intelligence, and an organization (medical workers having national qualifications) managing the system.SELECTED DRAWING: Figure 3
Inventors:
SHIMIZU HIDEKI
SHIRAI YURI
SHIRAI YURI
Application Number:
JP2018101015A
Publication Date:
November 14, 2019
Filing Date:
May 10, 2018
Export Citation:
Assignee:
SHIMIZU HIDEKI
SHIRAI YURI
SHIRAI YURI
International Classes:
A61B5/05; A61B5/00