Title:
DATA ANALYSIS SUPPORTING DEVICE AND DATA ANALYSIS SUPPORTING PROGRAM
Document Type and Number:
Japanese Patent JP2019212170
Kind Code:
A
Abstract:
To provide, to a target apparatus, measurement data of a similar apparatus to the target apparatus determined by a type of an attribute which matches a purpose of data analysis so that the measurement data of analysis of an existing similar apparatus can be used.SOLUTION: In a data analysis support device 10, a data search unit 22 searches for a database 30, and extracts apparatuses 40 which have a specified type of attribute of types of attributes of a target apparatus from a plurality of apparatuses 40. A similarity calculation unit 23 calculates similarity between the specified type of attribute of the target apparatus and the specified type of attribute of the extracted apparatuses 40 with reference to the metadata 32 of the extracted apparatuses 40. A data generation unit 24 selects a similar apparatus as an apparatus 40 which has the similarity of at least a threshold value from the extracted apparatuses 40 and generates data 33 as a target of analysis from the measurement data 31 of the similar apparatus.SELECTED DRAWING: Figure 1
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Inventors:
NAKAGAWA KOICHI
KOSUGI MASARU
RYU KENGO
KAIEDA HIROKAZU
KOSUGI MASARU
RYU KENGO
KAIEDA HIROKAZU
Application Number:
JP2018109727A
Publication Date:
December 12, 2019
Filing Date:
June 07, 2018
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G06F16/00
Domestic Patent References:
| JP2018043491A | 2018-03-22 | |||
| JP2003329741A | 2003-11-19 | |||
| JP2006276992A | 2006-10-12 |
Foreign References:
| WO2011145374A1 | 2011-11-24 |
Attorney, Agent or Firm:
Mizoi International Patent Service Corporation