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Title:
EYEGLASSES MEASUREMENT SYSTEM AND EYEGLASSES MEASUREMENT PROGRAM
Document Type and Number:
Japanese Patent JP2020008601
Kind Code:
A
Abstract:
To provide an eyeglasses measurement system and an eyeglasses measurement program that measure a layout in a condition where an eyeglasses lens is framed into an eyeglasses frame.SOLUTION: An eyeglasses measurement system measuring eyeglasses comprises: first acquisition means that acquires first information relating to a thickness in a depth direction of a rim in an eyeglasses frame; second acquisition means that acquires second information relating to a height from a position of an outer edge of the rim to an optical center position of a lens in a condition where an eyeglasses lens is framed into a frame; and third acquisition means that acquires third information relating to a height from a position of a groove bottom of the rim to the optical center position in a framed condition on the basis of the first information acquired by the first acquisition means and the second information acquired by the second acquisition means.SELECTED DRAWING: Figure 1

Inventors:
TANAKA MOTOJI
Application Number:
JP2018126313A
Publication Date:
January 16, 2020
Filing Date:
July 02, 2018
Export Citation:
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Assignee:
NIDEK KK
International Classes:
G02C13/00; G02C7/02
Domestic Patent References:
JPH10166250A1998-06-23
JPH05138518A1993-06-01
JP2009269117A2009-11-19
JPH09168954A1997-06-30