Title:
IMAGE INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2020016471
Kind Code:
A
Abstract:
To enable an appropriate detection algorithm to be easily determined in surface defect inspection for even a user who does not know characteristics about a plurality of defect inspection algorithms or compatibility with a defect to be detected.SOLUTION: A first feature quantity and a second feature quantity pertaining to each pixel in an inspection area are extracted. A first defect inspection process of determining whether or not an aggregate of pixels having a first feature quantity larger than a prescribed threshold should be detected as a defect, and a second defect inspection process of determining whether or not an aggregate of pixels having a second feature quantity larger than a prescribed threshold should be detected as a defect are executed. Selection of either the first defect inspection process or the second defect inspection process is accepted after a first image showing the first defect inspection process and a second image showing the second defect inspection process are displayed.SELECTED DRAWING: Figure 22
Inventors:
SHIMODAIRA MASATATSU
Application Number:
JP2018137845A
Publication Date:
January 30, 2020
Filing Date:
July 23, 2018
Export Citation:
Assignee:
KEYENCE CO LTD
International Classes:
G06T1/00; G01N21/88; G06T7/11
Attorney, Agent or Firm:
Maeda patent office