Title:
PROBE PIN AND SOCKET
Document Type and Number:
Japanese Patent JP2020017428
Kind Code:
A
Abstract:
To provide a probe pin capable of obtaining good conductivity.SOLUTION: A probe pin includes: a first plunger having a first contact portion provided at a lower end, a first body portion provided above the first contact portion, and a first wall portion extending in the front-rear direction from the first body portion; and a second plunger having a second contact portion provided at an upper end, and a second body portion provided below the second contact portion. The second body portion presses the first wall portion.SELECTED DRAWING: Figure 1A
Inventors:
HANAKADA TSUKASA
Application Number:
JP2018140273A
Publication Date:
January 30, 2020
Filing Date:
July 26, 2018
Export Citation:
Assignee:
ENPLAS CORP
International Classes:
H01R13/24; G01R1/067; G01R1/073
Domestic Patent References:
| JPS62157576A | 1987-07-13 |
Foreign References:
| US20080064236A1 | 2008-03-13 | |||
| US5227718A | 1993-07-13 | |||
| WO2011013731A1 | 2011-02-03 | |||
| WO2014136884A1 | 2014-09-12 | |||
| WO2016021723A1 | 2016-02-11 |
Attorney, Agent or Firm:
Washeda International Patent Office