Title:
SYSTEM AND METHOD FOR EVALUATING STRUCTURE
Document Type and Number:
Japanese Patent JP2020046330
Kind Code:
A
Abstract:
To precisely determine a state of a structure.SOLUTION: A structure evaluation system according to one embodiment includes: an acquisition unit for acquiring image data of a structure; and a determination unit for determining a state of the structure on the basis of the image data. The determination unit, (A) calculates displacements of at least one measurement point of the structure and of a reference point of the structure from the image data, (B) calculates a ratio of the displacement of each of the at least one measurement point and the displacement of the reference point as a relative displacement, and (C) determines the state of the structure on the basis of the relative displacement of each of the at least one measurement point.SELECTED DRAWING: Figure 2
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Inventors:
KOBAYASHI MOTONARI
KONISHI TEPPEI
SAITO TAKAHITO
IKEDA DAIZO
KONISHI TEPPEI
SAITO TAKAHITO
IKEDA DAIZO
Application Number:
JP2018175784A
Publication Date:
March 26, 2020
Filing Date:
September 20, 2018
Export Citation:
Assignee:
NTT DOCOMO INC
International Classes:
G01M99/00; E01D22/00; G01B11/00
Attorney, Agent or Firm:
Yoshiki Hasegawa
Yoshiki Kuroki
Takashi Okiyama
Kenji Fukaishi
Yoshiki Kuroki
Takashi Okiyama
Kenji Fukaishi