Title:
SAMPLING OSCILLOSCOPE AND AUTOMATIC ADJUSTMENT METHOD OF WAVEFORM
Document Type and Number:
Japanese Patent JP2020064006
Kind Code:
A
Abstract:
To provide a sampling oscilloscope capable of reducing the time required for scale adjustment.SOLUTION: A sampling oscilloscope 1 samples a signal input from a measurement object W and displays an eye waveform on a display screen 7a. The oscilloscope has a function of automatically adjusting the amplitude and phase of the eye waveform using the sampling data at the start of measurement of the object W so that the eye waveform is positioned in the center on the display screen 7a.SELECTED DRAWING: Figure 1
Inventors:
YOKOYAMA HIROKI
Application Number:
JP2018196738A
Publication Date:
April 23, 2020
Filing Date:
October 18, 2018
Export Citation:
Assignee:
ANRITSU CORP
International Classes:
G01R13/20
Attorney, Agent or Firm:
Norimitsu Nishimura
Noriyuki Suzuki
Noriyuki Suzuki