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Patent Searching and Data


Title:
OVER-PIN DIAMETER MEASURING DEVICE AND MICROMETER
Document Type and Number:
Japanese Patent JP2020118529
Kind Code:
A
Abstract:
To provide an over-pin diameter measuring device that is high in flexibility when measuring an effective diameter of a screw shaft and a gear and enables measurement of high accuracy by easy operation, and provide a micrometer.SOLUTION: An over-pin diameter measuring device mounted to an anvil 1 and a spindle 2 of a micrometer includes a though-hole 7 for containing tip ends of the anvil 1 and the spindle 2, and a guide hole 6 for intersecting and penetrating the though-hole 7. The over-pin diameter measuring device is characterized in that the though-hole 7 guides the side face of the anvil 1 or the spindle 2 up to the guide hole 6, includes a depth to loosely engage the contact pin N, and holds the side of the contact pin N loaded at the place toward both openings of the though-hole 7.SELECTED DRAWING: Figure 1

Inventors:
IKEHARA KOJI
SASAKI HITOSHI
Application Number:
JP2019009127A
Publication Date:
August 06, 2020
Filing Date:
January 23, 2019
Export Citation:
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Assignee:
IKEHARA KOJI
SASAKI HITOSHI
International Classes:
G01B3/18
Domestic Patent References:
JPS6443701A1989-02-16
JP2016114449A2016-06-23
JPS51127067U1976-10-14
JPS5661404U1981-05-25
JPS5219245U1977-02-10
Foreign References:
US6219932B12001-04-24
Attorney, Agent or Firm:
Shunichi Fujii