Title:
INSPECTION DEVICE, PROGRAM, AND INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2021015125
Kind Code:
A
Abstract:
To provide an inspection device that conducts different types of inspections for an inspection object article, thereby preventing an inspection line from becoming longer, and that can easily, efficiently and rapidly perform setting operation such as image processing relating to a photographic image taken with an imaging part that takes an image of the inspection object article.SOLUTION: An inspection device includes: imaging means for taking an image of an inspection object article; acquisition means for acquiring identification information on the article from a position different from a photographing position of the article photographed with the imaging means; storage means for storing positive information to be a comparison object of the inspection article; transportation means for transporting the article; and control means for comparing the photographic image by the imaging means and the identification information by the acquisition means with the positive information stored in the storage means, and determining whether they agree or not. When the article is transported by the transportation means, the storage means associates an imaging result by the imaging means with the identification information by the acquisition means and stores them as positive information.SELECTED DRAWING: Figure 1
Inventors:
KOMIYAMA MINEYOSHI
KAWASHIMA KEISUKE
KAWASHIMA KEISUKE
Application Number:
JP2020176555A
Publication Date:
February 12, 2021
Filing Date:
October 21, 2020
Export Citation:
Assignee:
TERAOKA SEIKO KK
International Classes:
G01N21/88
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Attorney, Agent or Firm:
Eichi International Patent Office