Title:
POSITION MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2021067657
Kind Code:
A
Abstract:
To more accurately correct a detection value from a position detection section in a position measurement method for a device that comprises an imaging section and the position detection section for detecting a position of the imaging section and uses the detection value from the position detection section when a measurement point is photographed to measure position coordinates of the measurement point in a specific coordinate system.SOLUTION: A device acquires position coordinates in a specific coordinate system of index sections (22) on a calibration plate (20) on which the index sections (22) are arranged two-dimensionally as actually measured values, acquires differences between the actually measured values and true values obtained by converting the position coordinates of the index sections (22) in relation to the standard of the calibration plate (20) acquired beforehand by another device to position coordinates in the specific coordinate system as correction values, corrects a detection value of position detection sections (8, 9, 10) using the correction values. An imaging section (3) measures position coordinates of a plurality of measurement points (P) by photographing the plurality of measurement points (P) on an object (11) to be measured according to a predetermined route, and the correction values are acquired so as to be associated with the route.SELECTED DRAWING: Figure 4
Inventors:
HAYASHI SHINGO
MATSUYAMA AKIHISA
MATSUYAMA AKIHISA
Application Number:
JP2019195716A
Publication Date:
April 30, 2021
Filing Date:
October 28, 2019
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO
International Classes:
G01B11/00
Attorney, Agent or Firm:
Hidewa Patent Office