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Title:
PARTICLE BEAM QUALITY EVALUATION APPARATUS AND PARTICLE BEAM QUALITY EVALUATION METHOD
Document Type and Number:
Japanese Patent JP2021137106
Kind Code:
A
Abstract:
To provide a particle beam quality evaluation technology capable of achieving simplification and efficiency enhancement of work and space saving for an attachment storage area.SOLUTION: A particle beam quality evaluation device 10 includes: an attachment 15 attached to an irradiation port 25 of a particle beam 26; a first evaluation part 11 for making the particle beam 26 incident, and evaluating first quality; a first frame 21 connected to the attachment 15 for supporting the first evaluation part 11; a second evaluation part 12 (Fig. 5) for making the particle beam 26 incident for evaluating second quality; and a second frame 22 (Fig. 5) connected to the attachment 15 in place of the first frame 21, for supporting the second evaluation part 12.SELECTED DRAWING: Figure 1

Inventors:
SHIMADA TOMOYA
Application Number:
JP2020034847A
Publication Date:
September 16, 2021
Filing Date:
March 02, 2020
Export Citation:
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Assignee:
TOSHIBA CORP
TOSHIBA ENERGY SYSTEM & SOLUTION CORP
International Classes:
A61N5/10; A61B6/00
Domestic Patent References:
JP2017012308A2017-01-19
JPH1164530A1999-03-05
JP2014124407A2014-07-07
Foreign References:
WO2018160742A12018-09-07
Attorney, Agent or Firm:
Patent business corporation Tokyo International Patent Office