Title:
MEASURING METHOD, MEASURING DEVICE, MEASURING SYSTEM, AND MEASURING PROGRAM
Document Type and Number:
Japanese Patent JP2021148536
Kind Code:
A
Abstract:
To provide a measuring method that can separately calculate displacement of a structure caused by each of a plurality of movable bodies moving in a row.SOLUTION: A measuring method includes the steps of: acquiring first observation point information including the time at which parts of an m-th movable body pass through a first observation point and physical quantities that are responses to actions; acquiring second observation point information including the time at which the parts pass through a second observation point and physical quantities that are responses to actions; calculating deflection waveforms of the structure caused by the parts; adding the deflection waveforms to calculate an m-th movable body deflection waveform; calculating a displacement waveform at a third observation point; and taking a waveform obtained by multiplying an m-th amplitude coefficient by the m-th movable body deflection waveform as an m-th amplitude adjustment deflection waveform, and calculating first to M-th amplitude coefficients such that the sum of the first to M-th amplitude adjustment deflection waveforms and the displacement waveform are approximate to each other.SELECTED DRAWING: Figure 24
Inventors:
KOBAYASHI SACHIHIRO
Application Number:
JP2020047308A
Publication Date:
September 27, 2021
Filing Date:
March 18, 2020
Export Citation:
Assignee:
SEIKO EPSON CORP
International Classes:
G01M5/00; E01D22/00; G01B21/00; G08G1/015
Attorney, Agent or Firm:
Kazuaki Watanabe
Satoshi Nakai
Hiroki Matsuoka
Satoshi Nakai
Hiroki Matsuoka