Title:
ABNORMALITY ANALYSIS DEVICE
Document Type and Number:
Japanese Patent JP2021152792
Kind Code:
A
Abstract:
To provide an abnormality analysis device capable of analyzing abnormality with high sensitivity.SOLUTION: An abnormality analysis device comprises reference time domain signal generation means that generates a reference time domain signal that uses a specific time interval and a specific phase time domain signal, detected by detection means 2 and extracted from an original time domain signal S emitted by a normal device 1, as a diagnostic reference from a normal time domain signal. The reference time domain signals are classified based on a frequency at which the device 1 operates, and for the original time domain signal S to be diagnosed detected by the detection means, abnormality analysis means 30 analyzes the abnormality of the device 1 based on the reference time domain signals having the same specific time interval and specific phase.SELECTED DRAWING: Figure 1
Inventors:
KANEUCHI TAKESHI
KAWAMURA YOSUKE
KAWAMURA YOSUKE
Application Number:
JP2020053153A
Publication Date:
September 30, 2021
Filing Date:
March 24, 2020
Export Citation:
Assignee:
OSAKA GAS CO LTD
International Classes:
G05B23/02; G01H17/00; G01M99/00
Attorney, Agent or Firm:
Masahiro Miyaji
Kunihiko Higashi
Kunihiko Higashi