Title:
【考案の名称】検品用サンプル追跡装置
Document Type and Number:
Japanese Patent JP2525385
Kind Code:
Y2
Inventors:
Umezawa Shigeo
Aoki Naohiro
Toshifumi Kobayashi
Niimi Jutsu
Nobuyuki Nagai
Aoki Naohiro
Toshifumi Kobayashi
Niimi Jutsu
Nobuyuki Nagai
Application Number:
JP3331688U
Publication Date:
February 12, 1997
Filing Date:
March 14, 1988
Export Citation:
Assignee:
Shin Oji Paper Co., Ltd.
International Classes:
G01B21/06; B26D1/56; G01D7/00; G06M7/00; (IPC1-7): G06M7/00; B26D1/56; G01D7/00
Domestic Patent References:
| JP62132576A | ||||
| JP5766304A |
Attorney, Agent or Firm:
Rikichi Ichikawa