Title:
【考案の名称】蛍光X線分析装置
Document Type and Number:
Japanese Patent JP2559773
Kind Code:
Y2
Inventors:
Toshio Watanabe
Application Number:
JP8722490U
Publication Date:
January 19, 1998
Filing Date:
August 21, 1990
Export Citation:
Assignee:
Seiko Instruments Co., Ltd.
International Classes:
G01N23/223; G01N1/28; (IPC1-7): G01N1/28; G01N23/223
Domestic Patent References:
| JP63305237A | ||||
| JP1171606A | ||||
| JP6483140A | ||||
| JP56109042U | ||||
| JP52145874U | ||||
| JP55143557U | ||||
| JP5638862U |
Attorney, Agent or Firm:
Keinosuke Hayashi