Title:
【考案の名称】半導体メモリ試験装置
Document Type and Number:
Japanese Patent JP2598803
Kind Code:
Y2
Inventors:
Kenichi Fujisaki
Application Number:
JP7239393U
Publication Date:
August 23, 1999
Filing Date:
December 15, 1993
Export Citation:
Assignee:
Advantest Corporation
International Classes:
G01R31/28; G11C29/00; (IPC1-7): G11C29/00; G01R31/28
Domestic Patent References:
| JP3269279A |