Title:
【発明の名称】フリップフロップテスト方式
Document Type and Number:
Japanese Patent JP2599759
Kind Code:
B2
Abstract:
PURPOSE:To execute a delay test by a ring oscilloscope in a logic circuit containing an FF by connecting an output terminal of a 2-multiplying circuit to a clock input terminal and connecting an input terminal of the 2-multiplying circuit to a data input terminal. CONSTITUTION:A data input D of an FF 1 is connected to an input of a 2-multiplying circuit 8, and a clock input terminal CP of the FF 1 is connected to an output of the circuit 8. In this state, the circuit 8 operates so that an output frequency becomes two times of an input frequency. When an output terminal of this circuit 8 is connected to a clock input of the FF 1, and the input terminal CP of the circuit 8 becomes a data input, the frequency of the clock input terminal of the FF 1 operates by two times of the input frequency. An output waveform of the FF 1 which has been operated by this clock waveform becomes 1/2 of a clock waveform frequency, and becomes the same frequency as that of an input waveform. As a result, the frequencies of the input waveform and the output waveform of the FF 1 coincide, and by returning this output to the input terminal CP, a ring oscillator can be constituted easily.
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Inventors:
Bunichi Fujita
Application Number:
JP12934688A
Publication Date:
April 16, 1997
Filing Date:
May 26, 1988
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
G01R31/28; G01R31/317; (IPC1-7): G01R31/317
Domestic Patent References:
| JP58213528A | ||||
| JP62242873A | ||||
| JP62113074A |
Attorney, Agent or Firm:
Makoto Suzuki