Title:
【発明の名称】光ディスクのグループ欠陥の大きさ測定方法
Document Type and Number:
Japanese Patent JP2652887
Kind Code:
B2
Inventors:
KAWAMOTO HIROAKI
ASANO MAKIO
NARA KEI
ASANO MAKIO
NARA KEI
Application Number:
JP12858489A
Publication Date:
September 10, 1997
Filing Date:
May 22, 1989
Export Citation:
Assignee:
HITACHI DENSHI ENJINIARINGU KK
International Classes:
G01B11/02; G01N21/88; G01N21/93; G01N21/95; G11B7/26; (IPC1-7): G01B11/02; G01N21/88; G11B7/26
Domestic Patent References:
| JP6371641A | ||||
| JP562070A | ||||
| JP61104439A |
Attorney, Agent or Firm:
Kajiyama Bozen (1 person outside)