Title:
【発明の名称】IC試験装置
Document Type and Number:
Japanese Patent JP2817132
Kind Code:
B2
Abstract:
PURPOSE:To test a high-speed element by a method wherein strobe pulses returned to an IC tester body are given to a time-adjusting circuit through an another signal passage whose delay time is equal to that of a signal passage and their time is adjusted. CONSTITUTION:Strobe pulses STRBs for time adjustment are given to a first time-adjusting circuit 22 on the side of a test head 20 through a first signal passage 31. The response output signal of an IC 21 to be tested is time-adjusted by the time-adjusting circuit 22. Its time-adjusted output is given to a second time-adjusting circuit 11 through a second signal passage 32, and it is time- adjusted again. Its time-adjusted output is input to a logic comparator 12, it is logic-compared with an expected value, and whether the IC 21 is good or not is judged. In addition, a third signal passage 33 returns the pulses STRBs which have been given to the time-adjusting circuit 22, and it gives them to the time-adjusting circuit 11. That is to say, the pulses STRBs which have been given to the time-adjusting circuits 22 are returned to an IC tester body 10 through the signal passage 33 whose delay time is equal to that of the signal passage 32, and the time-adjusting circuit 11 performs a time-adjusting operation by using the returned pulses STRBs.
Inventors:
Toshiyuki Negishi
Application Number:
JP22131593A
Publication Date:
October 27, 1998
Filing Date:
September 06, 1993
Export Citation:
Assignee:
Advantest Corporation
International Classes:
G01R31/319; G01R31/28; (IPC1-7): G01R31/28; G01R31/319
Attorney, Agent or Firm:
Kusano Taku (1 person outside)