Title:
【発明の名称】検出素子の感度補正方法とX線検出装置
Document Type and Number:
Japanese Patent JP2882048
Kind Code:
B2
Abstract:
PURPOSE:To enable early discovery of abnormality by making a calculation part obtain sensitivity correction coefficient in advance and making a memory part store the coefficient, and by comparing the stored sensitivity correction coefficient to new sensitivity correction coefficient which is measured prior to commencement of the measurement. CONSTITUTION:Average value AVS is recalculated, excluding elements that are substantially different correction coefficient strored in a memory element part 6 and are recognized as abnormality detection elements. From this AVS, correction coefficient for each detection element CnHs, is calculated. Those coefficients are made to be stored and a detection object is placed and then measurement is conducted. In case that the first element is the abnormality detection element, an average value of the second and the third ones is taken, and, in case that the 512th element is the abnormality detection element, an average value of the 510th and the 511th ones is taken, in order to conduct interpolation treatment. By the process said above, accurate measurement can be executed even in case that abnormality exists at the detection element.
Inventors:
OOTSUCHI TETSUO
OOMORI YASUICHI
BABA MATSUKI
TSUTSUI HIROSHI
OOMORI YASUICHI
BABA MATSUKI
TSUTSUI HIROSHI
Application Number:
JP33395590A
Publication Date:
April 12, 1999
Filing Date:
November 29, 1990
Export Citation:
Assignee:
MATSUSHITA DENKI SANGYO KK
International Classes:
A61B6/03; G01N23/08; G01T7/00; G01T1/24; (IPC1-7): G01T1/24; A61B6/03; G01N23/08
Domestic Patent References:
| JP4138325A |
Attorney, Agent or Firm:
Fumio Iwahashi (2 others)