Title:
【発明の名称】測定スケール
Document Type and Number:
Japanese Patent JP2963926
Kind Code:
B2
Abstract:
PCT No. PCT/GB89/01019 Sec. 371 Date Aug. 19, 1990 Sec. 102(e) Date Aug. 19, 1990 PCT Filed Aug. 17, 1989 PCT Pub. No. WO90/02315 PCT Pub. Date Mar. 8, 1990.An optical metrological scale produced by a rolling method, to give a profiled upper scale surface which is imparted by an embossing roller. To prevent uneven strains, which could affect the pitch of the scale, the support roller has a similar embossing profile, so that the lower side of the scale is also given a profiled surface. The embossing roller is freely rotatable, while the support roller is driven.
Inventors:
RAMESU SUTEIIBUN EDOWAADO
HENINGU BURAIAN SESHIIRU ROBAATO
MORISON ROBAATO BOIDO
HENINGU BURAIAN SESHIIRU ROBAATO
MORISON ROBAATO BOIDO
Application Number:
JP50931689A
Publication Date:
October 18, 1999
Filing Date:
August 17, 1989
Export Citation:
Assignee:
RENISHO PLC
International Classes:
B21B1/22; B21B1/38; B21C51/00; B21H7/00; G01D5/30; B21H8/00; B44B5/00; G01B3/00; G01D5/347; (IPC1-7): G01D5/30; B21B1/22; B21C51/00; B21H8/00
Domestic Patent References:
| JP59178144A | ||||
| JP5614041A | ||||
| JP6046822A | ||||
| JP60159518A | ||||
| JP6390331A | ||||
| JP6250035A | ||||
| JP5947016A | ||||
| JP5971835A | ||||
| JP64500224A |
Other References:
【文献】米国特許5088209(US,A)
【文献】米国特許4017367(US,A)
【文献】米国特許4017367(US,A)
Attorney, Agent or Firm:
Yoshikazu Tani