Title:
【発明の名称】光波形測定装置
Document Type and Number:
Japanese Patent JP2970961
Kind Code:
B2
Abstract:
PURPOSE:To provide a light waveform measurement device capable of detecting intensity change of light to be measured stably with high time resolution with the lapse of time. CONSTITUTION:A laser device 51 generates laser beams to excite a sample to be measured. An oscillation control device 52 controls laser oscillation of the laser device 51. A streak tube 56 detects light to be measured from the excited sample to be measured. A deflecting voltage generating circuit 55 generates deflecting voltage to drive a deflecting plate 56b of this streak tube 56. The deflecting voltage generated by the deflecting voltage generating circuit 55 is used as a control signal to control operation of the oscillation control device 52, and generation of the laser beams is set to be synchronized with this deflecting voltage, so that a trigger circuit is unnecessary to process a driving signal generated by the oscillation control device 52 in itself. Thereby, jitter can be eliminated, so that light waveform measurement can be carried out stably with the lapse of time in measurement of the service life and so on.
Inventors:
TAKAHASHI SATOSHI
Application Number:
JP21394791A
Publication Date:
November 02, 1999
Filing Date:
August 26, 1991
Export Citation:
Assignee:
HAMAMATSU HOTONIKUSU KK
International Classes:
G01J1/42; G01J11/00; (IPC1-7): G01J1/42; G01J11/00
Domestic Patent References:
| JP3189567A | ||||
| JP2249932A | ||||
| JP5529787A | ||||
| JP4110928U |
Attorney, Agent or Firm:
Yoshiki Hasegawa (3 outside)