Title:
【発明の名称】AAL1-SAR機能の試験方法及び装置
Document Type and Number:
Japanese Patent JP3005553
Kind Code:
B1
Abstract:
PROBLEM TO BE SOLVED: To provide a test method and device that can confirm which of segmentation/reassembly functions of an ATM adaptation layer AAL1-cell division assembly SAR function block has a fault. SOLUTION: An AAL1-SAR function block 12 divides data of a digital multiplex channel to generate an ATM cell and the ATM cell is reassembled into data of the digital multiplex line to conduct a wrap test of the AAL1-SAR function. A segmentation counter 103 counts the number of data of the digital multiplex channel from the start of the division to its end, and the number of ATM cells to be generated is calculated from the data number. Furthermore, an ATM cell number generated by the AAL1-SAR function block is counted by a cell counter 104. A comparator 105 compares an ATM cell number to be generated with a generated ATM cell number to examine a division function. A fault location can easily be identified through the wrap test and the division function test.
Inventors:
Hitoshi Nagai
Application Number:
JP32177098A
Publication Date:
January 31, 2000
Filing Date:
November 12, 1998
Export Citation:
Assignee:
NEC Communication Systems, Ltd.
International Classes:
H04L12/26; H04L12/28; (IPC1-7): H04L12/28; H04L12/26
Domestic Patent References:
| JP3270446A |
Attorney, Agent or Firm:
Yuuji Katsuragi