Title:
【発明の名称】帯状体の不良部分検出機
Document Type and Number:
Japanese Patent JP3027202
Kind Code:
B2
Abstract:
PCT No. PCT/JP92/00013 Sec. 371 Date Sep. 4, 1992 Sec. 102(e) Date Sep. 4, 1992 PCT Filed Jan. 10, 1992 PCT Pub. No. WO92/12410 PCT Pub. Date Jul. 23, 1992.A plurality of probes 3 or 10 are arranged in a conveying path of a web 1 or 9 comprising a slit sheet or a nonwoven fabric for contact with the web 1 or 9. The probes 3 or 10 are rotatably supported and arranged so that if a defect portion exists in the web 1 or 9, the probes 3 or 10 rotate to the defect portion of the web and protrude under the web, and when the probes 3 or 10 protrude under the web, a detecting means 6b outputs a defect detection signal.
Inventors:
Kintaro Aihara
Shinji Yamazaki
Shinji Yamazaki
Application Number:
JP1243891A
Publication Date:
March 27, 2000
Filing Date:
January 10, 1991
Export Citation:
Assignee:
Nippon Petrochemical Co., Ltd.
Polymer Processing Laboratory Co., Ltd.
Polymer Processing Laboratory Co., Ltd.
International Classes:
B65H63/00; D06H3/08; D06H3/10; G01N19/04; G01N19/08; G01N21/89; G01N21/892; G01N33/36; G01N3/02; (IPC1-7): G01N19/04
Domestic Patent References:
| JP2257039A | ||||
| JP60134108U | ||||
| JP6276604U |
Attorney, Agent or Firm:
Tetsuya Ito