Title:
リニヤスケールにおける計測信号生成回路
Document Type and Number:
Japanese Patent JP3557584
Kind Code:
B2
Abstract:
A measurement signal generating circuit for a linear scale capable of increasing an Signal-to-Noise (S/N) ratio, wherein S stands for Corona signal strength, and N for noise strength ratio of a signal for measurement of a linear scale. A photo detector or a low-pass filter for removing noise entering the measurement signal generating circuit is arranged rearwardly of each of an A phase signal generating circuit and a B phase signal generating circuit. Such construction permits a noise component at a different phase as well as that at the same phase to be effectively removed during synthesis of the measurement signal, to thereby reduce an error in measuring by the linear scale.
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Inventors:
Takahisa Uehira
Toshihiko Kuga
Toshihiko Kuga
Application Number:
JP2000273154A
Publication Date:
August 25, 2004
Filing Date:
September 08, 2000
Export Citation:
Assignee:
Futaba Electronics Co., Ltd.
International Classes:
G01D5/14; G01D5/245; G01D5/36; G01R19/00; (IPC1-7): G01D5/36; G01D5/245
Domestic Patent References:
| JP3276017A | ||||
| JP7333005A | ||||
| JP3042517A | ||||
| JP11311544A | ||||
| JP60063111U | ||||
| JP5885116A |
Attorney, Agent or Firm:
Atsuo Waki
Nobuo Suzuki
Nobuo Suzuki