Title:
測定誤差の補正方法および電子部品特性測定装置
Document Type and Number:
Japanese Patent JP3558086
Kind Code:
B1
Abstract:
A high-precision, multi-port compatible, relative correction method and apparatus for correcting measurement errors covering an increase in the number of ports of a non-coaxial electronic component, in which a relative correction adapter 31 is provided that is formed of a two-port network connected to each port of a production test fixture 5B adjacent to a measurement apparatus. The relative correction adapter has a characteristic that modifies the electrical characteristics generated by the production test fixture 5B having an electronic component under test mounted thereon into electrical characteristics generated by a standard test fixture 5A having the electronic component under test mounted thereon. An error factor of the relative correction adapter 31 is identified from a standard test fixture measurement value and a production test fixture measurement value of a correction data acquisition specimen 11B. A production test fixture measurement value of the electronic component under test 11A is corrected with the error factor of the relative correction adapter 31 to thereby obtain the standard test fixture measurement value of the electronic component under test 11A which is assumed to be obtained when the electronic component under test 11A
Inventors:
Kamiyadake
Application Number:
JP2003347251A
Publication Date:
August 25, 2004
Filing Date:
October 06, 2003
Export Citation:
Assignee:
MURATA MANUFACTURING CO.,LTD.
International Classes:
H05K13/00; G01R27/28; G01R35/00; (IPC1-7): G01R35/00; G01R27/28
Domestic Patent References:
| JP3105264A | ||||
| JP8043463A | ||||
| JP61112971A | ||||
| JP62191774A | ||||
| JP2003240827A |
Attorney, Agent or Firm:
Kazuhide Okada
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