Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
低照射量走査ビーム型デジタルX線撮影システム用X線検出器
Document Type and Number:
Japanese Patent JP3569526
Kind Code:
B2
Abstract:
A scanning beam digital x-ray imaging system according to the present invention includes an x-ray tube (10) having an electron beam source (161) and a target anode (50). Circuitry is provided for focussing the beam (164) and scanning the beam (20, 30) across the target anode (50) in a predetermined pattern such as a serpentine scan pattern. A collimating element (90), preferably in the form of a perforated grid containing an array of apertures (140), is interposed between the x-ray source (50) and an object to be x-rayed (80). The apertures (140) are oriented to form x-ray beams (100) converging at a detector array (110) on a plane (270) located a selected distance from the collimating element (90). That distance is selected to allow placing the object to be x-rayed (80) in between the collimating element (90) and the detector array (110). A segmented x-ray detector array (110) containing a rectangular matrix of detector elements (170) is located in the detection plane (270). A focal plane (280) is created which gives optimal resolution at a particular, selectable distance from the x-ray source (50).

Inventors:
Willent, John William
Mooreman, Jack Wilson
Skiricorn, Brian
Fiekowski, Peter Joseph
Application Number:
JP52247394A
Publication Date:
September 22, 2004
Filing Date:
April 05, 1994
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
Nextray Incorporated
International Classes:
G21K1/02; A61B6/00; A61B6/02; A61B6/03; A61B6/06; A61B6/12; G01T1/00; G01T1/161; G01T1/20; G01T1/202; G01T1/29; G03B42/02; G06T1/00; G21K5/02; H01J35/14; H01J35/24; H01L31/09; H04N5/225; H05G1/10; H05G1/64; (IPC1-7): A61B6/00
Domestic Patent References:
JP58177637A
JP2297850A
JP56019855A
JP58168979A
JP60123683U
JP56014199A
Foreign References:
US5140162
US5099128
US4288697
US2730566
US5237598
Attorney, Agent or Firm:
Akira Okawa
Takashi Tanabe