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Title:
X線分析方法及び装置
Document Type and Number:
Japanese Patent JP3610370
Kind Code:
B2
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Inventors:
Yuuki Tanaka
Yuji Horino
Fujii Kaneei
Application Number:
JP17138895A
Publication Date:
January 12, 2005
Filing Date:
June 14, 1995
Export Citation:
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Assignee:
National Institute of Advanced Industrial Science and Technology
International Classes:
G01N23/225; (IPC1-7): G01N23/225
Domestic Patent References:
JP4164206A
JP53106166A
Other References:
J.A.van Kan and R.D.Vis,"Total Reflection PIXE(TPIXE) and RBS for Surface Analysis",X-RAY Spectrometry,1995年,Vol.24,No.2,p.58-62
堀野裕治他5名,「高速イオンマイクロプローブによる局所分析」,応用物理,日本,社団法人応用物理学会,1995年 5月10日,第64巻第5号,第438-444頁



 
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