Title:
基板検査用治具及び検査用プローブ
Document Type and Number:
Japanese Patent JP3849948
Kind Code:
B1
Abstract:
[PROBLEMS] To provide a jig for inspecting substrates and an inspection probe to be used for inspecting electrical characteristics of substrates to be inspected. [MEANS FOR SOLVING PROBLEMS] A jig (1) for inspecting substrates is composed of an inspection probe (2) wherein a first end section (23) is electrically in contact with a prescribed inspecting position (101) of a substrate (100) to be inspected; a connecting electrode (4) having an electrode section (41) in electrically contact with a second end section (24) of the inspection probe (2); and a holding body (3) for holding the inspection probe (2). The holding body (3) is provided with a first guide section (31) having a first guide hole (311) for guiding the first end section (23) to the inspection position (101), and a second guide section (32) whereupon a second guide hole (321) is formed for guiding the second end section (24) to the electrode section (41). The inspection probe (2) is composed of a flexible linear conducting section (21) having the first end section (23) and the second end section (24), and an insulating section (22) applied for insulation on an outer circumference of the conducting section (21) excluding the first end section (23) and the second end section (24). The length of the second end section (24) is shorter than that of the second guide hole (321).
Inventors:
Minoru Kato
Makoto Fujino
Miyatake Tadashi
Makoto Fujino
Miyatake Tadashi
Application Number:
JP2005332172A
Publication Date:
November 22, 2006
Filing Date:
November 16, 2005
Export Citation:
Assignee:
Nidec Read Corporation
International Classes:
G01R1/06; G01R1/067; G01R31/02; H05K3/00
Domestic Patent References:
| JP2005338065A | ||||
| JP2004279133A | ||||
| JP2002090410A | ||||
| JP2003222637A | ||||
| JP2005099037A | ||||
| JP2005106832A |
Attorney, Agent or Firm:
Hideaki Kitamura