Title:
検査される物体の体積表示を有するデータセットを解析する方法
Document Type and Number:
Japanese Patent JP3871267
Kind Code:
B2
Abstract:
Method of analyzing a data set of an object to be examined, which data set includes voxels of at least a first type and a second type, and a computer program for carrying out the method. The method includes the steps of classifying the voxels as voxels of the first, the second or further types, thereafter determining which of the voxels of the first type are boundary voxels that adjoin voxels of the second or further types, thereafter assigning a data value to each voxel of the first type, the data value representing a measure of the distance between the voxel and the neatest boundary voxel., and thereafter classifying the voxels of the first type that have a distance data valve exceeding a predetermined threshold as aberration voxels indicative of an aberration in the object.
Inventors:
Bruence, Johannes
Application Number:
JP2002553732A
Publication Date:
January 24, 2007
Filing Date:
December 07, 2001
Export Citation:
Assignee:
Koninklijke Philips Electronics N.V.
International Classes:
A61B5/055; A61B6/03; A61B6/00; G06T1/00; G06T17/00
Domestic Patent References:
| JP2036305A | ||||
| JP11507565A | ||||
| JP10099308A |
Foreign References:
| WO2000016696A1 | ||||
| EP1346324A1 | ||||
| US20020114510 |
Attorney, Agent or Firm:
Tadahiko Ito
Shinsuke Onuki
Tadashige Ito
Sadao Sasaki
Shinsuke Onuki
Tadashige Ito
Sadao Sasaki