Title:
X線計測装置
Document Type and Number:
Japanese Patent JP3987676
Kind Code:
B2
Abstract:
The present invention provides an x-ray measuring apparatus for diagnosis having high spatial resolution and high sensitivity, which includes: an x-ray source for emitting x-rays from an x-ray focal spot; an x-ray detector in which a plurality of sensing elements each having a sensitive part and a blind part surrounding the sensitive part are arranged two-dimensionally; data processing means for collecting output signals of the sensing elements and performing data processing; and an anti-scatter grid disposed between the x-ray focal spot and the x-ray detector with predetermined distance from the position of the x-ray focal spot and in which an x-ray transmitting member and an x-ray shielding member are alternately arranged in a first direction. A pitch in the first direction of linear images projected on a sensing surface of the x-ray detector of the x-ray shielding member by the x-ray is set to be substantially an integral multiple of two or larger of the pitch of arrangement of the sensing elements in the first direction. In such a manner, a moiré-free image of a wide field of view is obtained.
Inventors:
Rika Baba
Ken Ueda
Ken Ueda
Application Number:
JP2000213370A
Publication Date:
October 10, 2007
Filing Date:
July 10, 2000
Export Citation:
Assignee:
Hitachi Medical Co., Ltd.
International Classes:
G01N23/04; A61B6/06; G01T1/00; G01T7/00; G21K1/02
Domestic Patent References:
| JP200060843A | ||||
| JP6154207A | ||||
| JP5744999A | ||||
| JP1235839A | ||||
| JP200065995A | ||||
| JP10305030A | ||||
| JP966054A | ||||
| JP975332A | ||||
| JP6237927A | ||||
| JP6319729A | ||||
| JP1057361A |
Foreign References:
| US5949850 |
Attorney, Agent or Firm:
Katsuo Ogawa
Kyosuke Tanaka
Kyosuke Tanaka