イメージセンサアレイの欠陥の検出システム

Title:

イメージセンサアレイの欠陥の検出システム

Document Type and Number:

Japanese Patent JP3988848

Kind Code:

B2

Abstract:

A test circuit incorporated as part of an image sensor array having a plurality of image sensors and associated transfer circuits includes a test line associated with each photosensor. In a test mode, a signal output from a photosensor can be substituted with a predetermined voltage from an external source. By providing a predetermined test voltage to the transfer circuits and then reading out signals from the transfer circuits, faults in the transfer circuits can be isolated from faults in the photosensors.

Inventors:

Scott El Twinkle
Jagdish Sea Tan Dong
Paul A Hosier

Application Number:

JP26170298A

Publication Date:

October 10, 2007

Filing Date:

September 16, 1998

Export Citation:

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