Title:
表面電位測定装置
Document Type and Number:
Japanese Patent JP4008362
Kind Code:
B2
Inventors:
Takeharu Tani
Application Number:
JP2003033759A
Publication Date:
November 14, 2007
Filing Date:
February 12, 2003
Export Citation:
Assignee:
FUJIFILM Corporation
International Classes:
G01N21/27; G01R29/12; G01R29/24
Domestic Patent References:
| JP6258368A | ||||
| JP6167443A | ||||
| JP518890A | ||||
| JP5332937A | ||||
| JP815355A | ||||
| JP62254039A | ||||
| JP63259444A | ||||
| JP2002357540A | ||||
| JP2001194298A | ||||
| JP2000338109A | ||||
| JP3188615B2 |
Foreign References:
| WO2002066162A1 |
Other References:
岡本隆之,“エバネッセント波を用いた表層屈折率測定センサー:原理と実装”,分光研究,日本,社団法人日本分光学会,1998年 2月15日,第47巻・第1号,p.19-28
Attorney, Agent or Firm:
Yanagita Seiji
Go Sakuma
Go Sakuma