Title:
メモリテスト方法、情報記録媒体及び半導体集積回路
Document Type and Number:
Japanese Patent JP4015025
Kind Code:
B2
Inventors:
Tatsuya Kamei
Tamaki Mitsuaki
Hisayoshi Ide
Ken Tatezawa
Haruo Ii
Tamaki Mitsuaki
Hisayoshi Ide
Ken Tatezawa
Haruo Ii
Application Number:
JP2002572003A
Publication Date:
November 28, 2007
Filing Date:
February 20, 2002
Export Citation:
Assignee:
Renesas Technology Corp.
International Classes:
G06F12/16; G06F9/38; G06F11/267; G06F15/78; G11C29/08
Domestic Patent References:
| JP10511790A | ||||
| JP56044942A | ||||
| JP7160585A |
Attorney, Agent or Firm:
Shizuyo Tamamura