Title:
検査装置及び液滴吐出検査方法
Document Type and Number:
Japanese Patent JP4079127
Kind Code:
B2
Abstract:
An inspection apparatus includes an inspection body that has a non-conductive substrate, a droplet receiving portion for receiving a droplet that is provided on the substrate, and a plurality of electrodes that are exposed on an inner surface portion of the droplet receiving portion. The droplet receiving portion has a size that corresponds to a droplet size in a state when a discharged droplet impacts normally. The inspection apparatus also includes a detector that is connected to the electrodes of the inspection body and detects a conductivity in the droplet receiving portion. The inspection apparatus makes it possible to inspect easily and in a short time period the discharge performance of a droplet discharge head of a droplet discharge apparatus. A droplet discharge inspection method is also provided.
Inventors:
Toshimasa Mori
Application Number:
JP2004195621A
Publication Date:
April 23, 2008
Filing Date:
July 01, 2004
Export Citation:
Assignee:
Seiko Epson Corporation
International Classes:
B05C11/00; B05C5/00; B41J2/125; B41J2/175
Domestic Patent References:
| JP2004148180A | ||||
| JP63221050A | ||||
| JP1163859U | ||||
| JP4111942A | ||||
| JP2503227A |
Attorney, Agent or Firm:
Kazuya Nishi
Masatake Shiga
Masakazu Aoyama
Masatake Shiga
Masakazu Aoyama