Title:
光学分析用チップとその製造方法、光学分析用装置、および光学分析方法
Document Type and Number:
Japanese Patent JP4117665
Kind Code:
B2
Inventors:
Hideki Miyazaki
Kurokawa Yoichi
Kurokawa Yoichi
Application Number:
JP2007505902A
Publication Date:
July 16, 2008
Filing Date:
February 24, 2006
Export Citation:
Assignee:
National Institute for Materials Science
International Classes:
G01N21/64; G01N21/65
Domestic Patent References:
| JP2005195441A | ||||
| JP2005345402A | ||||
| JP2005195397A |
Attorney, Agent or Firm:
Koichi Kamata