To provide a method for selecting the composition of a material for use in forming an organic electronic element in order to form the organic electronic element excellent in reliability.
This method for selecting the composition of the material for use in forming the organic electronic element is composed of a process for preparing a plurality of materials for forming the organic electronic element comprising different compositions, a process for measuring the state change of the interface of the material for forming the organic electronic element and a light waveguide as a spectrum by applying or while applying an external element causing a change with the elapse of time to a plurality of the materials for forming the organic electronic element, a process for performing the time-base development of a spectrum to stepwide measure the change caused in the materials for forming the organic electronic element by a different kind of analytic means, a process for comparing the data of a spectrum with a different kind of analytic data for every stage and a process for comparing the data of the spectrum respectively acquired from a plurality of the materials for forming the organic electronic element with a different kind of the analytic data for every stage to select the composition of the optimum materials for forming the organic electronic element.
COPYRIGHT: (C)2005,JPO&NCIPI
Koji Kuroda
Kozo Takahashi
Horiuchi Michio
System Instruments Co., Ltd.
| JP2001108611A | ||||
| JP2002234892A | ||||
| JP2000306672A |