Title:
間隔が密なテスト部位のための走査式試験機
Document Type and Number:
Japanese Patent JP4216482
Kind Code:
B2
Abstract:
A scan tester for printed circuit boards capable of testing densely spaced test locations on the circuit board including a desk top robot having a test head positioned over the circuit board and movable in a three-dimensional plane. The test head includes a non-contact energy source such as a source of plasma located at an end of the test head for energizing the test locations of the printed circuit board. The printed circuit board is mounted on a test fixture having a plurality of translator plates and translator pins for contacting a second surface of the printed circuit board to translate test signals to an electronic test analyzer.
Inventors:
Mark A. Swart
Application Number:
JP2001026872A
Publication Date:
January 28, 2009
Filing Date:
February 02, 2001
Export Citation:
Assignee:
DELAWARE CAPITAL FORMATION,INC.
International Classes:
G01R1/06; G01R1/067; G01R31/02; G01R31/28; G01R31/302; H05K3/00
Domestic Patent References:
| JP7151834A | ||||
| JP6256872A | ||||
| JP1092883A | ||||
| JP213862A | ||||
| JP6390173U | ||||
| JP63157675U | ||||
| JP611498Y2 |
Foreign References:
| WO1999056137A1 |
Attorney, Agent or Firm:
Takashi Ishida
Jun Tsuruta
Koichi Itsubo
Masaya Nishiyama
Higuchi Souji
Jun Tsuruta
Koichi Itsubo
Masaya Nishiyama
Higuchi Souji