Title:
逐次的横方向結晶化法による処理中及び処理後のシリコンフィルムの表面平坦化法
Document Type and Number:
Japanese Patent JP4220156
Kind Code:
B2
Abstract:
Systems and methods for reducing a surface roughness of a polycrystalline or single crystal thin film produced by the sequential lateral solidification process are disclosed. In one arrangement, the system includes an excimer laser (110) for generating a plurality of excimer laser pulses of a predetermined fluence, an energy density modulator (120) for controllably modulating the fluence of the excimer laser pulses such that the fluence is below that which is required to completely melt the thin film, a beam homoginizer (144) for homoginizing modulated laser pulses in a predetermined plane, a sample stage (170) for receiving homoginized laser pulses to effect melting of portions of the polycrystalline or single crystal thin film corresponding to the laser pulses, translating means for controllably translating a relative position of the sample stage (170) with respect to the laser pulses, and a computer (110) for coordinating the excimer pulse generation and fluence modulation with the relative positions of the sample stage (170) to thereby process the polycrystalline or single crystal thin film by sequential translation of the sample stage (170) relative to the laser pulses.
Inventors:
James S
Robert es sposiri
Mark ak loader
Robert es sposiri
Mark ak loader
Application Number:
JP2001569872A
Publication Date:
February 04, 2009
Filing Date:
March 21, 2000
Export Citation:
Assignee:
The Trustees of Columbia University in the City of New York
International Classes:
H01L21/20; B23K26/00; B23K26/06; B23K26/08; H01L21/00; H01L21/26; H01L21/268; H01L21/302; H01L21/31; H01L21/38
Domestic Patent References:
JP878330A | ||||
JP1276714A | ||||
JP2003509845A |
Foreign References:
WO1997045827A1 |
Attorney, Agent or Firm:
Kosaku Sugimura
Kenji Sugimura
Eiji Fujiwara
Kenji Sugimura
Eiji Fujiwara
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