To simply inspect a function about an electronic component having a terminal in its side.

In this inspection method for the electronic component, an anisotropic conductive connector having a film base material comprising an insulating material, and having a plurality of continuity paths insulated each other within the film base material and penetrated through both main faces of the base material is sandwiched between a circuit board and the electronic component having the terminal in its side to apply pressure, so as to bring the circuit board into continuity with the electronic component to allow the function inspection. The anisotropic conductive connector having the continuity paths arranged inclinedly substantially parallely to each other to cross the axial center with a perpendicular on the main face of the film base material is used in the method.

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