Title:
微粒子標識を使用した分析物アッセイ
Document Type and Number:
Japanese Patent JP4247770
Kind Code:
B2
Abstract:
Method for specific detection of one or more analytes in a sample. The method includes specifically associating any one or more analytes in the sample with a scattered-light detectable particle, illuminating any particle associated with the analytes with light under conditions which produce scattered light from the particle and in which light scattered from one or more particles can be detected by a human eye with less than 500 times magnification and without electronic amplification. The method also includes detecting the light scattered by any such particles under those conditions as a measure of the presence of the analytes.
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Inventors:
Igellabide, Juan
Egella Bide, Evangelina Yi
Corn, david lee
Jeffrey Tee, Jackson
Egella Bide, Evangelina Yi
Corn, david lee
Jeffrey Tee, Jackson
Application Number:
JP2000517107A
Publication Date:
April 02, 2009
Filing Date:
October 16, 1998
Export Citation:
Assignee:
The Regents of The University of California
International Classes:
G01N15/14; C07H19/00; G01N33/532; C12M1/00; C12N15/09; C12P19/34; C12Q1/00; C12Q1/02; C12Q1/68; C12Q1/70; G01N15/00; G01N21/21; G01N21/27; G01N21/47; G01N31/00; G01N33/53; G01N33/536; G01N33/543; G01N33/58; G01N37/00
Domestic Patent References:
| JP4233465A | ||||
| JP61225656A | ||||
| JP8505231A |
Attorney, Agent or Firm:
Hatsushi Shimizu
Toshi Gobe
Koichi Niimi
Tomohiko Kobayashi
Shinichi Watanabe
Ryuichi Inoue
Go Sueyoshi
Shosuke Imai
Tadahiko Kurita
Tatsuo Tomizu
Toshi Gobe
Koichi Niimi
Tomohiko Kobayashi
Shinichi Watanabe
Ryuichi Inoue
Go Sueyoshi
Shosuke Imai
Tadahiko Kurita
Tatsuo Tomizu