予め計算された波形をイオン単離および衝突誘導解離のために使用するイオントラップ質量分析計

Title:

予め計算された波形をイオン単離および衝突誘導解離のために使用するイオントラップ質量分析計

Document Type and Number:

Japanese Patent JP4253589

Kind Code:

B2

Abstract:

In a quadrupole ion trap mass spectrometer, a library of optimized notched waveforms are pre-calculated, optimized and stored in a fast memory such as semiconductor RAM. Computer controlled apparatus selectively applies the pre-calculated waveforms to end caps of the quadrupole ion trap for isolating an ion with a specific mass to charge ratio. The pre-calculated waveforms are optimized notch waveforms with each waveform being pre-calculated for a specific mass. The memory further stores a library of single frequency CID waveforms for use in collision induced dissociation of an isolated ion. By providing the pre-calculated waveforms, a method is provided to isolate and dissociate a selected ion.

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Inventors:

Wealth, Gregory

Application Number:

JP2003564901A

Publication Date:

April 15, 2009

Filing Date:

January 17, 2003

Export Citation:

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